Remotely Accessible Instruments for Nanotechnology (RAIN) Network

Atomic Force Microscope (AFM)

The atomic force microscope (AFM) is one of about two dozen types of scanned-proximity probe microscopes. All of these microscopes work by measuring a local property – such as height, optical absorption, or magnetism – with a probe or “tip” placed very close to the sample. The small probe-sample separation (on the order of the instrument’s resolution) makes it possible to take measurements over a small area. To acquire an image the microscope raster-scans the probe over the sample while measuring the local property in question. The resulting image resembles an image on a television screen in that both consist of many rows or lines of information placed one above the other. 

Appropriate for: 9th grade +

Remote Access Available at: COSINC, SLCC

Demo Only Available at: CNEU, ECC

Energy-Dispersive X-Ray Spectroscopy (EDS)

Energy-dispersive X-ray spectroscopy (EDS, EDX, or XEDS), sometimes called energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing unique set of peaks on its X-ray emission spectrum.

 Appropriate for: 6th grade +

Available at: ECC

Field Emission Electron Probe Microanalyzer (FE-EPMA)

An electron microprobe (or electron probe microanalyzer) is a specialized scanning electron microscope, optimized for accurate and precise quantitative compositional analysis of solid materials at the micro-scale. It is fundametally the same as an SEM, with the added capability of chemical analysis. By using a field emission type electron gun, a smaller light source is possible and resolution is greatly improved. This makes it possible to analyze smaller microscopic areas. It is used for imaging of sample morphology and compositional variation, as well as compositional analysis by X-ray spectroscopy with ~1% precision.

Appropriate for: 8th grade +

Available at: Caltech

Optical Profiler

An optical profiler is a type of characterization equipment used for obtaining true color 3D data of a surface at the sub-micron level. Optical profilers combine key attributes of optical microscopes and standard stylus-type profilers. An optical profiler achieves the true color and wide field of view (FOV) nature of an optical microscope while simultaneously obtaining the nanometer level z-resolution of a standard stylus profiling technique.

Appropriate for: all grade levels

Available at: Rio Salado College

Scanning Electron Microscope (SEM)

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample’s surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam’s position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, in low vacuum, in wet conditions (in environmental SEM), and at a wide range of cryogenic or elevated temperatures.

The Field Emission Scanning Electron Microscope (FESEM) has a much brighter electron source and smaller beam size than a typical SEM, increasing the useful magnification of observation and imaging up to 500,000x. The FESEM has enhanced observation of very fine surface features, electron beam sensitive materials, and non-conductive materials. It is ideal for imaging polymer materials and thin films.

Appropriate for: all grades

SEM Available at: ASU, COSINC, ECC, SLCC

FESEM Available at: Caltech, COSINC, CNEU

Transmission Electron Microscope (TEM)

A TEM collects images of samples by passing a beam of electrons through the sample. This allows users to resolve the internal structure of samples. To produce a standard TEM image, the electron beam must be able to penetrate the sample, with many electrons being transmitted through it. The difference between the numbers of transmitted and scattered electrons from individual areas in the specimen results in the contrast necessary to form a TEM image. The LVEM5 Desktop TEM has a maximum magnification of 700,000x. This microscope can perform in three functions modes: TEM, SEM, and Electron Diffraction. TEM mode makes it possible to image nanomaterials and thin sections. Electron diffraction provides structural characterization of crystalline materials.

Appropriate for: all grade levels

Available at: SLCC

3D Nanoprinter (Lithography)

Nanoscribe’s 3D Microfabrication systems and solutions are based on Two-Photon Polymerization (2PP). 2PP is a key enabling technology for high-precision 3D printing objects and structures of virtually any shape with submicron details. Minimum XY feature size: 160 nm typical; Finest XY resolution: 400 nm typical.

Appropriate for: all grades

Available at: COSINC, GATech

X-Ray Fluorescence (XRF)

XRF is the emission of characteristic “secondary” (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings.

Appropriate for: all grade levels

Available at: NCMN/NNF University of Nebraska-Lincoln